JSM -6610 LV SEM 



JSM -6610 LV SEM is a high performance scanning electron microscope for fast characterization and imaging of fine structures. It has a medium-size chamber and stage, multiple ports, and has additional analytical attachments including a heating/cooling substage and EDS system. This SEM can handle a wide variety of sample sizes and shapes providing the versatility of dealing with samples that are wet, oily, out-gas excessively or are non-conductive without pre-treatment.

Accelerating Voltage: Ranges from 300 V to 30kV

  • Magnification: Ranges from 5X to 400,000X
  • Resolution: 3.0nm at 30kV
  • Imaging Modes:
    • High vacuum: SE (secondary electron)
    • BSE (backscatter electron)
    • Low vacuum (Variable pressure)
  • Field of View: Up to 25.4mm

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Energy Dispersive Spectrometer (EDS)

The JEM 6610LV Scanning Electron Microscope (SEM) is equipped with EDS. SEM/EDS provides chemical analysis of the field of view or spot analyses of minute particles.
The EDS Analysis System for SEM was designed for a wide range of applications. Whether simply collecting a spectrum or performing complex phase analysis, the system is easy to get the quick results you want.

EDS analysis is best suited for:

  • Metals and metal alloys
  • Ceramics
  • Minerals
  • Certain types of polymeric materials.