Gatan PIPS II Precision Ion Polishing System

Model 695 precision ion polishing system for TEM specimen preparation by broad ion beam milling with argon.

Features

  • X-Y stage for alignment of the Ar beam to region of interest on the sample
  • Voltages as low as 100 V for fast and damage free preparation of FIB milled specimens
  • Digital imaging and analysis in DigitalMicrograph®
  • 10" color touch screen for display and control

Specifications

  • Accelerating voltage: 100 V – 8 kV
  • Milling angle: -10° to +10°
  • Ion current density peak: 10mA/cm2
  • Sample size: 3 mm diameter disc
  • Rotation speed: 1 – 6 rpm
  • X, Y transition: ± 0.5 mm

 

 

Gatan PIPS IIPIPS II system at LSU SIF

 

LSU